Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Researchers from Stony Brook University, in collaboration with Ecosuite and Ecogy Energy, have developed a self-supervised machine-learning algorithm designed to identify physical anomalies in solar ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...

Not long ago, spotting an AI-generated image felt almost easy. The internet circulated a familiar checklist: count the fingers, look ...

Researchers report that the integration of machine learning and Internet of Things (IoT) technologies is enabling a new generation of intelligent industrial environments capable of real-time ...

Using a novel technique for defect detection, researchers from EPFL have settled a long-running dispute over laser additive manufacturing procedures. A graphic representation of the experimental setup ...