Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

AUSTIN, Texas — Aiming to move test to the register-transfer level, engineer Nikhil Dakwala is preparing a tool that he calls the industry's first memory RTL-to-automatic test pattern generation (ATPG ...

The recent 6.0 earthquake near Napa California caused close to $50 million in damages to the wineries and property in the region. The San Francisco bay area is accustomed to earthquakes and hence ...

The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...

Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...