Nature

Automated Defect Detection in Sewer Pipelines Using Deep Learning

Advances in deep learning have transformed the field of infrastructure maintenance, particularly in the automated detection and characterisation of defects in sewer pipelines. Leveraging large volumes ...
Semiconductor Engineering

Wafer Bin Map Defect Classification Using Semi-Supervised Learning

A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
Semiconductor Engineering

Catching Critical Defects In TSVs And Stacked Chips

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
EurekAlert!

Researchers use machine learning to detect defects in additive manufacturing

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...